Unusual thermal fatigue behaviors in 60 nm thick Cu interconnects

نویسندگان

  • J. Zhang
  • J. Y. Zhang
  • G. Liu
  • Y. Zhao
  • X. D. Ding
  • G. P. Zhang
  • J. Sun
چکیده

Thermal fatigue of Cu interconnects 60 nm thick and 5–15 lm wide was investigated by using alternating current to generate cycling temperature and strain/stress. The fatigue curves exhibit two regions, i.e. highand low-cycle regions, which correspond to low and high thermal strains, respectively. The high-cycle region is found to be controlled by an unusual thermal fatigue mechanism of damage bands, which is related to a unique structure comprising only a single layer of grains distributed along the thickness. 2008 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

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تاریخ انتشار 2008